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POSTED BY NN Admin ON May 22nd, 2009
Euro AFM Forum Abstract Deadline Extended
The deadline for abstracts has been extended to June 15 for the Euro AFM Forum at the Technical University of Munich (TUM), Garching, Germany, July 1-3, 2009. The Euro AFM Forum is a conference for AFM researchers to share their cutting-edge research for both materials and life science applications. The Euro...
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POSTED BY dawnbonnell ON May 20th, 2009
Live Forums Continue to Advance the Field
The 3rd Live Forum will be held on Friday, May 22 11:30-1 PM, Eastern Standard Time. The topic is timely: Piezoresponse Force Microscopy. Some may view this technique as specialized for ferroelectric domain tracking. But in fact it can do much more. Imaging biological...
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POSTED BY sergeikalinin ON May 7th, 2009
Live Forum Series: Piezoresponse Force Microscopy
Electromechanical coupling, along with elastic and transport properties, is one of the primary functionality of inorganic, organic, and biological materials. Piezoresponse force Microscopy has emerged in the last decade as a universal and powerful tool for probing ferroelectric, multiferroic, and biological materials through detection of electromechanical responses. Despite the apparent...
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POSTED BY NN Admin ON May 6th, 2009
Veeco AFM Basic Training Course with the Innova AFM
Veeco is pleased to offer a Basic AFM Training Course for users of the Innova AFM. The purpose of this course is to provide users with the fundamental techniques needed to successfully image with the Innova AFM as well as familiarize them with scanner calibration and post image processing. General topics...
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POSTED BY NN Admin ON May 6th, 2009
Veeco AFM Webinar Series: Advances AFM Applications Using the New Dimension Icon
Join us for the latest presentation in the Veeco AFM Webinar Series - Advanced AFM Applications Using the New Dimension Icon AFM. Our guest researchers will show results that clearly benefited from the breakthrough X-Y closed-loop performance (positional accuracy of <0.15nm), low system noise (<35pm), and exceptionally stable, low-drift characteristics of...
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POSTED BY NN Admin ON May 6th, 2009
Veeco AFM Workshop Series: Dimension® Icon® Atomic Force Microscope (AFM)
You are invited to join us for an informative and interactive workshop to learn more about the unprecedented capabilities of the new Dimension® Icon® Atomic Force Microscope (AFM) from Veeco Instruments. During these workshops, you will see presentations from Veeco Application Scientists, and see the live demonstrations of the Icon in...
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