I’m pleased to be hosting the Nanoprobe Network’s next Live Forum on Wed. Oct. 14 2009, which will focus on Non-Contact AFM (NC-AFM). NC-AFM, a dynamic scanning force microscopy technique, has fulfilled the long-standing goal of true atomic resolution imaging on metal, semiconductor, and insulating surfaces. While traditionally performed in ultrahigh vacuum, recent developments have extended its high-resolution capabilities to technologically relevant environments, including liquids, biological solutions and ambient conditions.

This Live Forum is your chance to interact with other researchers, including international experts in NC-AFM, to ask questions, discuss challenges, and share ideas related to all aspects of NC-AFM, including experimental techniques, recent results, theoretical modeling, and applications.

Date: Wed. Oct. 14, 2009

Time: 1:00 – 3:00 pm Eastern Daylight Time (10:00 am – noon Pacific Daylight Time, 19:00 – 21:00 Middle European Time).

Link: Click on “Forums (New)” above, or click here.

Expert Guests: André Schirmeisen, University of Münester; Hendrik Hölscher, Karlsruhe Research Laboratory, Germany; Ruben Perez, Univesidad Autonoma de Madrid; and Udo Schwarz. Yale University