Posts by Brad Rangell
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NT-MDT Webinar – “Tip Enhanced Raman Scattering, approaching 10 nm spatial resolution in Raman imaging”
NT-MDT is pleased to announce their upcoming SPM webinar. Please join us for this informative and exciting event. Tip Enhanced Raman Scattering (TERS) is the technique utilizing a special AFM probe (nano-antenna) to localize light at the nanometer scale area near the probe apex. When scanning the sample with respect to...
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SPM Applications Engineer
NT-MDT is seeking experienced application engineers with a strong AFM background for a challenging position in Scanning Probe Microscopy. The following position is based out of the Santa Clara California area. Major duties Product demonstration of scanning probe microscopes to U.S. customers. Close cooperation with sales staff to achieve company targets. Generate sample data and...
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NT-MDT Workshop on New Approaches to Surface Analysis
Dear Colleagues, we would like to bring to your attention the NT-MDT workshop on New Approaches to Surface Analysis, which will be held at the 2011 Spring ACS Meeting. Dr. Pavel Dorozhkin of NT-MDT, will talk about new approaches to surface analysis using SPM combined with Raman spectroscopy. The workshop will...
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Spring ACS Exhibitors Workshop: Frontiers of Integration, AFM + Optical Microscopy & Spectroscopy
Frontiers of Integration: AFM + Optical Microscopy & Spectroscopy Where: Moscone Center, San Francisco California Room: 111 When: Monday, March 22, 3:30 PM - 6:00 PM The NTEGRA nanolaboratory provides a unique platform for integration of the most insightful and powerful microscopy and spectroscopy techniques. Due to the complete integration of hardware and software,...
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