Lehigh University, Bethlehem, PA

This course provides an understanding of the concepts, instrumentation, and applications of the rapidly expanding field of Scanning Probe Microscopy (SPM). Atomic Force Microscopy (AFM) will be covered extensively, but the course will also feature a variety of advanced SPM techniques, Scanning Tunneling Microscopy, fluid imaging, etc. The theory of operation for both imaging and spectroscopy will be addressed, with special attention being paid to instrument artifacts and methods to avoid them. The course features nearly equal time spent in instruction and hands-on labs, including with participant-provided specimens. Participants will therefore take away the necessary knowledge and practice to utilize the full potential of their own SPM systems for applications in the physical and biological sciences, including:

• Practical and theoretical aspects of AFM and STM operation
• Force-distance measurements (AFM indentation, Force-Volume, molecular interactions, instrumented Nano-indentation)
• Mechanical mapping (Phase imaging, multiple/higher order harmonics)
• Fluid measurements (Living cell work, Electrochemistry)
• Electric field/surface potential imaging
• Magnetic field imaging
• Piezo-force microscopy (PFM)
• Nanolithography
• Image Analysis
• System management and probe selection

Instructors: Nancy Burnham (Worcester Polytechnic Institute), Bryan Huey (University of Connecticut), Dmitri Vezenov (Lehigh University), Richard Vinci (Lehigh University)

Participating Companies: Agilent Technologies, Asylum Research, NT-MDT, Veeco Instruments

Each registrant receives the textbook, Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications 2^nd Ed., by Dawn Bonnell (Wiley 2000), as well as detailed laboratory notes for all hands-on exercises. In addition, everyone receives notes for specific lectures, a list of vendors and equipment suppliers, and the Lehigh DVD that contains free and demonstration versions of useful microscopy software. Sample probes from several vendors are also provided with support from probe manufacturers.

For more information contact:

Sharon Coe (610-758-5133)

Sharon.coe@lehigh.edu

www.lehigh.edu/microscopy

From Fundamentals to Advanced Applications

June 14-17, 2010

Lehigh University

Bethlehem, PA

This course provides an understanding of the concepts, instrumentation, and applications of the rapidly expanding field of Scanning Probe Microscopy (SPM).   Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) will be covered extensively, but the course will also feature a variety of advanced SPM techniques.  The theory of operation for both imaging and spectroscopy will be addressed, with special attention being paid to instrument artifacts and methods to avoid them.  Crucially, the course will include nearly equal time spent in instruction and hands-on labs. Participants will therefore take away the necessary knowledge and practice to utilize the full potential of SPM systems for applications in the physical and biological sciences, including:

• Practical and theoretical aspects of AFM and STM operation
• Force-distance measurements (AFM indentation, Force-Volume, molecular interactions, instrumented Nano-indentation)
• Mechanical mapping (Phase imaging, multiple/higher order harmonics)
• Fluid measurements (Living cell work, Electrochemistry)
• Electric field/surface potential imaging
• Magnetic field imaging
• Piezo-force microscopy (PFM)
• Nanolithography
• Image Analysis
• System management and probe selection

Instructors: Nancy Burnham (Worcester Polytechnic Institute), Bryan Huey (University of Connecticut), Bruce Koel (Lehigh University), Dmitri Vezenov (Lehigh University), Richard Vinci (Lehigh University)

Participating Companies: Agilent Technologies, Asylum Research,

NT-MDT, Veeco Instruments

Each registrant receives the textbook, Scanning Probe Microscopy and Spectroscopy:  Theory, Techniques, and Applications 2^nd Ed., by Dawn Bonnell (Wiley 2000), as well as detailed laboratory notes for all hands-on exercises.  In addition, everyone receives notes for specific lectures, a list of vendors and equipment suppliers, and the Lehigh DVD that contains free and demonstration versions of useful microscopy software. Sample probes from several vendors are also provided with support from probe manufacturers.

For more information contact:  Sharon Coe (Sharon.coe@lehigh.edu) URL:www.lehigh.edu/microscopy