Posts by Udo Schwarz
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Conference Report on the 12th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2009)
Progress in nanoscience and nanotechnology requires tools that enable the imaging and manipulation of mater at the atomic and molecular scale. Read More......
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Announcing our next Live Forum, Wed. Oct. 14 on Non-Contact AFM
I'm pleased to be hosting the Nanoprobe Network's next Live Forum on Wed. Oct. 14 2009, which will focus on Non-Contact AFM (NC-AFM). NC-AFM, a dynamic scanning force microscopy technique, has fulfilled the long-standing goal of true atomic resolution imaging on metal, semiconductor, and insulating surfaces. While traditionally performed in...
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12th International Conference on Noncontact Atomic Force Microscopy
Dear colleague, We invite you to participate at the 12th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2009), which will be held August 10-14, 2009 in New Haven, CT, USA. Noncontact atomic force microscopy is a dynamic scanning probe microscopy technique that has fulfilled the long-standing goal of true atomic...
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