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POSTED BY rshetty ON May 18th, 2012
AFM-IR Webinar: ‘nanoscale IR Spectroscopy – where AFM meets IR’ on Wed, May 23 at 11AM EST
The ability to identify material under an AFM tip has been identified as one of the "Holy Grails" of probe microscopy. IR spectroscopy can characterize and identify materials via vibrational resonances of chemical bonds and is a very widely used analytical technique. We have successfully integrated AFM with IR spectroscopy...
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POSTED BY tmehr ON May 16th, 2012
AFM Webinar -”Introduction and Innovations in High Speed, Quantitative Nanomechanical Imaging”, May 23
Asylum Research's Dr. Roger Proksch will present the webinar "Introduction and Innovations in High Speed Quantitative Nanomechanical Imaging" on May 23 at 8:00am and 5:00pm PDT. This presentation, the first in a three-part series, will begin with a survey of the mechanical properties that can be investigated with the wide array...
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POSTED BY Leonenko ON April 29th, 2012
International Scanning Probe Microscopy Meeting, Toronto, Canada, June 15-18 2012
14th Annual International Scanning Probe Microscopy Meeting, Toronto June 15-18 2012, Abstract deadline is extended to May 10, 2012, One day tutorial on Scanning Probe Microscopy on June 15th, Venue: Westin Harbour Castle Hotel, Toronto, Canada http://ispm2012.uwaterloo.ca/index.html Early Registration deadline is May 15th ISPM 2012 committee...
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POSTED BY mariaw ON April 16th, 2012
2012 Annual Nanoprobes Workshop at Stanford University
You are cordially invited to attend the Center for Probing the Nanoscale's 8th Annual Workshop, a one-day workshop on nanoscale probing and imaging. Meet CPN investigators and the broader Bay Area community interested in nanoscale imaging and metrology. Location: Jen-Hsun Huang Engineering Center, McKenzie Room 300 475 Via Ortega, Stanford, California 94305-4200 Hours: 8:30-6, with...
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POSTED BY mariaw ON April 5th, 2012
Stanford Summer Institute for Middle School Teachers – Nanotechnology
The Center for Probing the Nanoscale at Stanford University is accepting applications for its annual Summer Institute for Middle School Teachers on July 23-27, 2012. At the Institute, teachers learn about the physical concepts underlying nanotechnology and nanoscience in simple terms. Daily sessions focus on content lectures by Stanford scientists...
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POSTED BY dave11420 ON April 2nd, 2012
Normal force calculation
If I have a silicon substrate and I want to measure normal forces, I take the change in setpoint x the cantilever stiffness x the sensitivity from the force displacement (fd) curves. However, if I am scanning in a liquid (fluid cell) do I use the sensitivity from the fd curves...
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