“Advances in Methods and Applications of Scanning Probe Microscopy to Polymer Materials” co-hosted by the Division of Polymer Chemistry and Division of Colloid and Surface Science.

Abstracts should be submitted on-line on the PACS abstract submission site:  http://abstracts.acs.org. Click on POLY, select this symposium topic and follow instructions to submit an abstract with 150 or less words.  Deadline for abstract submission is March 19^th. 

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Symposium Description:.  This symposium will focus on recent research progress in both developing new SPM based methods for and novel applications of SPM methods to polymer materials.  The focus of developing these new methods and utilizing these applications should be to understand mechanical, rheological, thermal, electrical, and self-assembly behavior of polymers on the nanoscale and to establish composition-processing-morphology-performance relationships of polymers, polymer blends, and composites.  All SPM based methods will be considered, including traditional mechanical (phase, nanoindentation), thermal, and electrical based methods as well as more recently developed methods from single to multifrequency measurements and high speed AFM.   All experimental and theoretical aspects of SPM methods developed with specific relevance to polymer materials or application of such methods to polymer materials  will be covered.  Application of SPM to a wide variety of polymer materials is to be covered including amorphous and semicrystalline polymers, polymer nanocomposites, block copolymers, polymer compounds, elastomers and rubbers, impact copolymers or toughened polymers, conductive polymers, single polymer chains, etc.  Of particular interest is interpretation of AFM measurements that can be related to meaningful and relevant polymer material properties.

Confirmed Invited Speakers Include:

Robert Carpick (University of Pennsylvania), Steve Minne (Bruker), Yifu Ding (University of Colorado), Sergei Magonov (NT-MDT), Liang Fang (Arkema), Ken Nakajima (Tohoku University), Greg Haugstad (University of Minnesota), Rene Overney (University of Washington), Jamie Hobbs (University of Sheffield), Roger Proksch (Asylum Research), Donna Hurley (NIST), Arvind Raman, Purdue University, Kevin Kjoller (Anasys), Vladimir Tsukruk (Georgia Inst. of Tech), Mark Van Landingham (Army Research Lab), Gil Walker (University of Toronto), Robert Magerle (Technical University of Chemnitz) 

Nanovea today announced the arrival of the N3 line dedicated to providing high-end measurement technology to the broader market. Nanovea has fully automated their measurement techniques while designing to price in the $20K market.

This first Asylum Research webinar in our 2012 Webinar Series will be presented by AFM pioneer, inventor and Asylum Research co-founder, Dr. Jason Cleveland.

Date: Wednesday, February 22
Time: 8:00am-9:00am PST

REGISTER NOW

Invited Speakers include:

Wilhelm Barthlott (University of Bonn)
József Fortágh (University of Tübingen)
Ricardo Garcia (IMM Madrid)
Stanislav Gorb (CAU Kiel)
Armin Knoll (IBM Zürich)
Egbert Oesterschulze (TU Kaiserslautern)
Pascal Ruffieux (EMPA)

In addition, contributed talks and posters will be accepted till January 31, 2012. Please send your one-page abstract as a PDF-file via email to hendrik.hoelscher@kit.edu.

Please register by sending the registration to hendrik.hoelscher@kit.edu. The number of attendees is limited. The registration fee for the workshop is 100 €. A reduced fee for students is available at 50 €. Deadline for registration is February 19, 2012.

A Best Poster Award of 300 €, 200 €, and 100 € will be granted to the authors of the three best poster presentations by SPECS Surface Nano Analysis GmbH.

Follow the latest news at our web-page (http://www.imt.kit.edu/afm.php) and spread the word to your colleagues interested into AFM world-wide.

We look forward to welcome you in Karlsruhe!

Thomas Schimmel and Hendrik Hoelscher

June 18-21, Santa Clara, CA June 18-21, Santa Clara, CA
Special Symposium: Nanoscale Materials Characterization
www.techconnectworld.com/Nanotech2012/

Most technological research includes advanced characterization at the
nanoscale. This symposium targets a wide range of characterization techniques
including microscopy, scattering, spectroscopy/spectrometry, nanomechanical
and other tools, along with specimen preparation methods and handling. It is
essential that this burgeoning knowledge base be transparently presented to the
broadest technical community. This event promotes the rapid education,
dissemination, and commercialization of new characterization techniques into
industries based in both physical and life sciences. It seeks to introduce general
technique types to newcomers, report pioneering methods, and drill down into
new physical understandings, all the while addressing applications useful to
industrial engineers and technicians.

Advances in characterization include not only far-field probes (e.g., beams of
electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips,
fibers and nanotubes), but also a growing intellectual component whereby data
are manipulated, analyzed, rendered and simulated to yield meaningful
information. As some tools and methods have become more common and
practical, certain misunderstandings and misinterpretations also have crept into
the lexicon. Besides an element of “methods training” to promote the insightful
application of characterization tools in nanotechnology R&D, this symposium will
emphasize projects utilizing a spectrum of complementary techniques.

Topics & Application Areas

• Direct space imaging methods
• Indirect space methods & spectroscopy
• Polymer phase transition & kinetics
• Nanocomposites morphology &
structure
• Thin-film structure
• Characterizing nanocatalysis surfaces
• Micro/nano electronic devices
• Liquid suspensions/melts
• Other

Symposium Co-Organizers:  Dalia Yablon (ExxonMobil), Greg Haugstad (Univ. of Minnesota), Pierre Panine (Xenocs, SA)

Dear Colleague:

You are cordially invited to attend Nanobrücken II:  A Nanomechanical Testing Workshop, jointly presented by INM – Leibniz Institute for New Materials and Hysitron, Inc., with co-sponsorship from the JEOL company. This is the second workshop in the Nanobrücken series.

Professor Jeff De Hosson of the University of Groningen will deliver the keynote address to commence the workshop. This year’s workshop aims to highlight the very latest in hybrid nanomechanical research that utilizes nanomechanical testing combined with complementary techniques such as electrical properties measurements, in-situ observation, dynamic testing, and more. The topics will cover a broad range of materials and structures, and in some cases will emphasize environmental conditions such as temperature and vacuum.

Call for Abstracts and Registration details are available at the Nanobrücken II website. Everyone in the Nanomechanics Community is encouraged to participate in this event. We look forward to welcoming you in Saarbrücken.

Sincerely,
Your Nanobrücken II Program Committee: Prof. Eduard Arzt, INM Saarbrücken; Prof. Roland Bennewitz, INM Saarbrücken; Prof. Lars Hultman, Linköping University; Dr. Andreas Schneider, INM Saarbrücken; Dr. Oden Warren, Hysitron, Inc.

Site: Stanford University

Agilent Technologies’ second biennial “Nano Measure” scientific symposium will feature some of the world’s most prestigious scientists presenting leading-edge, nanomeasurement-driven research. The Nano Measure 2012 program includes four excitingly diverse, applications-focused sessions. All users of atomic force microscopes, nanomechanical test instrumentation, and complementary nanomeasurement techniques and technologies are encouraged to submit paper and poster abstracts online at the symposium website.

Applicants should submit curriculum vitae and references to Hendrik Hoelscher, Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany, hendrik.hoelscher@kit.edu

The event will be held from July 09th-11th, 2012, at the Wills Memorial Building, University of Bristol in the United Kingdom. The conference is jointly organized by Bruker, the University of Bristol, the Bristol Centre for Nanoscience and Quantum Information, and promises to build on the biological and physical sciences interdisciplinary strengths of each organization.

Highlighted by the Conference chairman Prof. Mervyn Miles (University of Bristol) and Co-chairman Prof. Heinrich Hörber (University of Bristol), Seeing at the Nanoscale 2012 will provide an optimum forum for scientists to have an in-depth discussion on a wide variety of nanotechnology topics. Abstracts can cover a wide range of nanoscale imaging and property characterisation applications as well as instrumental/technique development within the specific emphasis of the four sessions (see technical sessions below).

TECHNICAL SESSIONS
Session I: BioAFM
Chair: Yves Dufrêne – Université Catholique de Louvain (Belgium)
Invited Speakers:
- Simon Scheuring – INSERM/ Université of Marseille (France)
- Jean-Luc Pellequer – CEA Marcoule (France)

Session II:Energy, Graphene, Electronic Materials
Chair: Sergei V. Kalinin – Oak Ridge National Laboratory (USA)
Invited Speakers:
- David J. Fermin – University of Bristol (UK)
- Markus Raschke – University of Colorado (USA)

Session III: Extreme Instrumentation: Speed, Resolution, more
Chair: Franz J. Giessibl – University of Regensburg (Germany)
Invited Speakers:
- Toshio Ando – Kanazawa University (Japan)
- Georg Schitter – Vienna University of Technology (Austria)

Session IV: Polymers, Organic Molecules, and nanoMechanics
Chair: Julius Vancso – University of Twente (The Netherlands)
Invited Speakers:
- Jamie Hobbs – University of Sheffield (UK)
- Thilo Glatzel – University of Basel (Switzerland)

Submit your abstract Now!

http://www.bruker-axs.com/seeing_at_the_nanoscale-submit-abstract-2012.html

Abstract submission deadline: 12th March, 2012
Conference website: http://www.bruker-axs.com/seeing-2012

For further information on this unique conference or to submit your abstract, visit www.bruker-axs.com/seeing-2012 today!

We know this will be a very dynamic conference, and we look forward to your participation.
Best regards,
Marie-France