Nanoprobe Network » General

AFM-IR Webinar: ‘nanoscale IR Spectroscopy – where AFM meets IR’ on Wed, May 23 at 11AM EST

rshetty — Fri, 18 May 2012 16:40:03 +0000

The ability to identify material under an AFM tip has been identified as one of the “Holy Grails” of probe microscopy. IR spectroscopy can characterize and identify materials via vibrational resonances of chemical bonds and is a very widely used analytical technique. We have successfully integrated AFM with IR spectroscopy (AFM-IR) to obtain high quality infrared absorption spectra at arbitrary points in an AFM image, thus providing chemical characterization on the sub-100 nm length scale. The webinar will discuss:

How the AFM-IR technique works to provide simultaneous chemical and mechanical property information
NEW: polarization control that enables nanoscale molecular orientation studies. Data will be presented on molecular orientation of individual electrospun PVDF fibers
Applications ranging from reverse engineering to characterization of polymer blends, multilayer films, organic photovoltaics, life sciences etc

You can register at www.anasysinstruments.com

AFM Webinar -”Introduction and Innovations in High Speed, Quantitative Nanomechanical Imaging”, May 23

tmehr — Wed, 16 May 2012 14:56:37 +0000

Asylum Research’s Dr. Roger Proksch will present the webinar “Introduction and Innovations in High Speed Quantitative Nanomechanical Imaging” on May 23 at 8:00am and 5:00pm PDT. This presentation, the first in a three-part series, will begin with a survey of the mechanical properties that can be investigated with the wide array of both old and new nanoscale property mapping techniques available to materials scientists. We will then introduce two new techniques for nanomechanical studies that allow unambiguous interpretation of material properties: AM-FM and Loss Tangent. These techniques allow high speed, low force imaging in tapping mode – a proven, reliable, and gentle imaging technique- while providing quantitative Stiffness and Loss Tangent images. Free registration for either time slot can be found on the link below:

8:00am (PDT), May 23

5:00pm (PDT), May 23

http://www.asylumresearch.com/Webinars/

International Scanning Probe Microscopy Meeting, Toronto, Canada, June 15-18 2012

Leonenko — Sun, 29 Apr 2012 18:38:34 +0000

14th Annual International Scanning Probe Microscopy Meeting, Toronto June 15-18 2012,

Abstract deadline is extended to May 10, 2012,

One day tutorial on Scanning Probe Microscopy on June 15th,

Venue: Westin Harbour Castle Hotel, Toronto, Canada

http://ispm2012.uwaterloo.ca/index.html

Early Registration deadline is May 15th

ISPM 2012 committee

2012 Annual Nanoprobes Workshop at Stanford University

mariaw — Mon, 16 Apr 2012 19:49:16 +0000

You are cordially invited to attend the Center for Probing the Nanoscale’s 8th Annual Workshop, a one-day workshop on nanoscale probing and imaging. Meet CPN investigators and the broader Bay Area community interested in nanoscale imaging and metrology.

Location:
Jen-Hsun Huang Engineering Center, McKenzie Room 300
475 Via Ortega, Stanford, California 94305-4200

Hours:
8:30-6, with continental breakfast and lunch included. There will be a poster session from 4-6, with hors d’oeuvres served. Prizes will be awarded for the top 3 posters

Speakers so far:

Stuart Lindsay, Arizona State University
“Recognition Tunneling – An Interface Between Chemistry and Electronics”

Sarah Tolbert, University of California, Los Angeles
“Self-Organized Nanostructured Materials for Energy: Supercapacitors, Batteries, and Solar Cells“

Felice Frankel, Harvard University
“More Than Pretty Pictures”

Katherine Aidala, Mount Holyoke College
“Manipulating Magnetic States with a Local Circular Magnetic Field”

Carlos Arguello, Columbia University
“Fundamental Role of Disorder in Phase Transitions of Strongly-Interacting Materials”

H. Kumar Wickramasinghe, University of California, Irvine
“Raman Probe Force Microscope”

Ania Bleszynski Jayich, University of California, Santa Barbara
“Coherent Detection of Mechanical Motion with a Single Spin Qubit”

Michael Flatté, University of Iowa
“Nanoscale Manipulation and Control of a Solitary Dopant within a Semiconductor“

James Hone, Columbia University
“Graphene NEMS Resonators in the Quantum Hall Regime“

Fee Information and Registration Link

Questions:
Laraine Lietz-Lucas, lietz@stanford.edu

Stanford Summer Institute for Middle School Teachers – Nanotechnology

mariaw — Thu, 05 Apr 2012 21:05:32 +0000

The Center for Probing the Nanoscale at Stanford University is accepting applications for its annual Summer Institute for Middle School Teachers on July 23-27, 2012. At the Institute, teachers learn about the physical concepts underlying nanotechnology and nanoscience in simple terms. Daily sessions focus on content lectures by Stanford scientists and on inquiry-based modules that explicitly address California’s 5-8th grade physical science content standards. Teachers receive a hands-on activity kit with many fun activities that bring nanoscience into the classroom. Teachers also have the opportunity to tour research labs and to receive a $650 stipend and professional development units. For more information and to apply by May 7, visit http://simst.stanford.edu

Normal force calculation

dave11420 — Mon, 02 Apr 2012 16:59:09 +0000

If I have a silicon substrate and I want to measure normal forces, I take the change in setpoint x the cantilever stiffness x the sensitivity from the force displacement (fd) curves. However, if I am scanning in a liquid (fluid cell) do I use the sensitivity from the fd curves from the liquid or the fd curves from the silicon substrate in air?

Monday submission deadline – SPM Polymer symposium at ACS

dgyablon — Fri, 16 Mar 2012 18:29:16 +0000

Call for Abstracts – ACS Fall Meeting, 8/19-8/23 2012, Philadelphia PA

“Advances in Methods and Applications of Scanning Probe Microscopy to Polymer Materials”

This symposium will focus on recent research progress to understand mechanical, rheological, thermal, electrical, and self-assembly behavior of polymers on the nanoscale and to establish composition-processing-morphology-performance relationship. Experimental and theoretical aspects of all SPM based methods will be considered, including traditional mechanical, thermal, and electrical based methods as well as more recent multifrequency measurements and high speed AFM. Application of SPM to a wide variety of polymer materials is to be covered including amorphous and semicrystalline polymers, nanocomposites, block copolymers, elastomers, impact copolymers or toughened polymers, conductive polymers, single polymer chains, etc.

Invited speakers include:

Robert Carpick (University of Pennsylvania), Steve Minne (Bruker), Yifu Ding (University of Colorado), Sergei Magonov (NT-MDT), Liang Fang (Arkema), Ken Nakajima (Tohoku University), Greg Haugstad (University of Minnesota), Rene Overney (University of Washington), Jamie Hobbs (University of Sheffield), Roger Proksch (Asylum Research), Donna Hurley (NIST), Arvind Raman (Purdue University)

Kevin Kjoller (Anasys), Vladimir Tsukruk (Georgia Inst. of Tec)h, Mark Van Landingham (Army Research Lab), Gil Walker (University of Toronto), Robert Magerle (Technical University of Chemnitz), Julius Vancos (Univ. of Twente)

To submit abstract, go to http://abstracts.acs.org, POLY division, this symposium. Abstract and preprint submission deadline on March 19^th, 2012.

NT-MDT Webinar – “Tip Enhanced Raman Scattering, approaching 10 nm spatial resolution in Raman imaging”

brangell — Sat, 10 Mar 2012 01:37:15 +0000

NT-MDT is pleased to announce their upcoming SPM webinar. Please join us for this informative and exciting event.

Tip Enhanced Raman Scattering (TERS) is the technique utilizing a special AFM probe (nano-antenna) to localize light at the nanometer scale area near the probe apex. When scanning the sample with respect to the probe, the obtained optical (Raman or fluorescence) maps have lateral resolution which is not limited by the light diffraction. A deep integration of AFM with confocal Raman microscopy is required for successful TERS experiment.

In this webinar we will review the recent TERS results obtained by NT-MDT instruments and customers. Enhancement factors of a few orders of magnitude are observed using gold or silver TERS probes. 2D Raman maps with lateral resolution <15 nm are obtained for different types of samples: graphene, carbon nanotubes, organic molecules etc.

This webinar series will be presented by Dr. Pavel Dorozhkin of NT-MDT.

The same webinar will be presented twice, once for US and once for European time zones.

Registration for U.S. based attendees: https://www2.gotomeeting.com/register/749748714
Wednesday, March 21, 2012 10:00 AM – 11:00 AM PDT

Registration for European based attendees: https://www2.gotomeeting.com/register/382823522
Tuesday, March 20, 2012 11:00 AM – 12:00 PM CET

Abstract Submission Closes Feb 19 for Nanobrücken II: A Nanomechanical Testing Workshop, March 22-23, 2012, INM Saarbrücken, Germany

owarren — Thu, 16 Feb 2012 19:41:46 +0000

Dear Colleague:

You are cordially invited to attend Nanobrücken II: A Nanomechanical Testing Workshop, jointly presented by INM – Leibniz Institute for New Materials and Hysitron, Inc., with co-sponsorship from the JEOL company. This is the second workshop in the Nanobrücken series. The workshop’s scope has been broadened, and the abstract submission deadline is now February 19, 2012.

This year’s workshop aims to highlight the very latest in nanomechanics and nanotribology research, including the use of complementary techniques, such as in-situ observation in electron microscopes, simultaneous electrical characterization, superimposed dynamic testing, acoustic emission monitoring, and more. The workshop seeks to cover a broad range of materials and structures, as well as the influence of temperature and other environmental conditions, and is also open to computational contributions.

Invited Keynote Speaker: Prof. Jeff De Hosson, University of Groningen

Other Confirmed Invited Speakers: Prof. Daniel Kiener, University of Leoben; Prof. Oliver Kraft, Karlsruhe Institute of Technology; Dr. Johann Michler, EMPA – Swiss Federal Laboratories for Materials Science and Technology

Call for Abstracts and Registration details are available at the Nanobrücken II website. Everyone in the Nanomechanics/Nanotribology Community is encouraged to participate in this event. We look forward to welcoming you in Saarbrücken.

Sincerely,
Your Nanobrücken II Program Committee: Prof. Eduard Arzt, INM Saarbrücken; Prof. Roland Bennewitz, INM Saarbrücken; Prof. Lars Hultman, Linköping University; Dr. Andreas Schneider, INM Saarbrücken; Dr. Oden Warren, Hysitron, Inc.

“Smaller, Quieter, Faster Atomic Force Microscopy” Tutorial at the Biophysical Society Meeting, Feb. 26

tmehr — Wed, 15 Feb 2012 17:22:54 +0000

Join us for this tutorial at the Biophysical Society Meeting in San Diego.

“Smaller, Quieter, Faster Atomic Force Microscopy”
presented by Sophia Hohlbauch, Asylum Research

Sunday, Feb. 26
Room 22, San Diego Convention Ctr
5:00-6:30pm

The tutorial is free to all Biophysical Society Meeting attendees. Appetizers, beer and wine will be served prior to the tutorial. If you are unable to attend the tutorial, but would like copies of the slides, please email us.