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POSTED BY rshetty ON April 23rd, 2010
AFM based chemical composition via nanoscale IR Spectroscopy: Free Online Webinar
Click here to Register Anasys Instruments will host a free online webinar on the scientific breakthrough that achieves nanoscale chemical composition based on an AFM probe as a detector for IR spectroscopy. The technique enables simultaneous information on nanoscale mechanical properties. The webinar will cover the science...
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POSTED BY tmehr ON March 24th, 2010
SPM for Energy Applications Int’l Workshop Sept. 15-17
The Center for Nanophase Materials Sciences at Oak Ridge National Laboratory (ORNL) and Asylum Research are co-organizing the International Workshop for Scanning Probe Microscopy for Energy Applications, to be held at ORNL September 15-17, 2010. This workshop of invited and contributed talks will cover the recent advances in characterization of energy-relevant...
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POSTED BY tmehr ON March 24th, 2010
Multifrequency AFM Technical Talk at MRS
MRS Spring Meeting Session U4 Multifrequency Atomic Force Microscopy presented by Roger Proksch, Asylum Research Wed., April 7 Room 3000 Moscone West 8:30am Read More......
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POSTED BY brangell ON March 9th, 2010
Spring ACS Exhibitors Workshop: Frontiers of Integration, AFM + Optical Microscopy & Spectroscopy
Frontiers of Integration: AFM + Optical Microscopy & Spectroscopy Where: Moscone Center, San Francisco California Room: 111 When: Monday, March 22, 3:30 PM - 6:00 PM The NTEGRA nanolaboratory provides a unique platform for integration of the most insightful and powerful microscopy and spectroscopy techniques. Due to the complete integration of hardware and software,...
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POSTED BY tmehr ON March 8th, 2010
AFM in Biology Class, April 28-30
Asylum Research will hold the AFM in Biology Class in Santa Barbara, CA, April 28-30, 2010. The class, now in its 11th session, is open to all AFM scientists that wish to expand their AFM knowledge as it pertains to life science applications. The unparalleled training includes both lecture...
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POSTED BY sharcoe ON March 4th, 2010
SPM Course at Lehigh University
Scanning Probe Microscopy: From Fundamentals to Advanced Applications June 14-17, 2010 Lehigh University Bethlehem, PA This course provides an understanding of the concepts, instrumentation, and applications of the rapidly expanding field of Scanning Probe Microscopy (SPM). Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) will be covered extensively, but the course will also...
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