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AAFMT 2012

The “3rd International Workshop on Advanced Atomic Force Microscopy Techniques 2012” (AAFMT 2012) takes place in Karlsruhe, Germany, March 5-6, 2012.

Invited Speakers include:

Wilhelm Barthlott (University of Bonn)
József Fortágh (University of Tübingen)
Ricardo Garcia (IMM Madrid)
Stanislav Gorb (CAU Kiel)
Armin Knoll (IBM Zürich)
Egbert Oesterschulze (TU Kaiserslautern)
Pascal Ruffieux (EMPA)

In addition, contributed talks and posters will be accepted till January 31, 2012. Please send your one-page abstract as a PDF-file via email to

Please register by sending the registration to The number of attendees is limited. The registration fee for the workshop is 100 €. A reduced fee for students is available at 50 €. Deadline for registration is February 19, 2012.

A Best Poster Award of 300 €, 200 €, and 100 € will be granted to the authors of the three best poster presentations by SPECS Surface Nano Analysis GmbH.

Follow the latest news at our web-page ( and spread the word to your colleagues interested into AFM world-wide.

We look forward to welcome you in Karlsruhe!

Thomas Schimmel and Hendrik Hoelscher

This entry was posted on Thursday, December 15th, 2011 at 7:35 am and is filed under Events, General, News. You can follow any responses to this entry through the RSS 2.0 feed.

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