Attend an Atomic Force Microscopy eSeminar!
Agilent Technologies is proud to announce this AFM eSeminar as part of its ongoing educational series. This one-hour live event will be led by top scientists in their respective fields. The unique Agilent eSeminar format includes an open Q&A session in which all online attendees are welcome to query the presenters.
Fall 2008 eSeminar
Date: November 18 @ 12:00 p.m. Eastern
Title: AFM Image Optimization
Presenters: Michael Serry & Gil Min, Ph.D. (Agilent Technologies)
Collect the best AFM images possible! This seminar will address key topics such as recognizing reasonable images, low-fidelity images, and images that cannot be used because of artifacts. Common artifacts will be identified, along with options for eliminating them or reducing their impact on your measurements.
Join us for one or more of these exciting live events!
Agilent eSeminars feature a user-friendly, web-based conferencing system that allows you and your colleagues to take part in real-time, interactive presentations on subjects that are pertinent to your work.
Information about event was submitted by Agilent Technologies.
