Veeco AFM Basic Training Course with the Innova AFM
Veeco is pleased to offer a Basic AFM Training Course for users of the Innova AFM. The purpose of this course is to provide users with the fundamental techniques needed to successfully image with the Innova AFM as well as familiarize them with scanner calibration and post image processing.
General topics covered
- Innova Microscope Setup
- Contact Mode
- Tapping Mode
- Scan Optimization
- Offline Analysis
- Scanner Calibration
Dates: June 23-24, 2009 in Santa Barbara, CA
More Info and Registration Information (url typed out http://www.veeco.com/support/show_training_detail.aspx?TrainingID=46)
This event was submitted by Karen Gertz, Veeco Marketing Communications Program Manage. Â
