Nanoprobe Network

AFM-IR Webinar: ‘nanoscale IR Spectroscopy – where AFM meets IR’ on Wed, May 23 at 11AM EST

rshetty — Fri, 18 May 2012 16:40:03 +0000

The ability to identify material under an AFM tip has been identified as one of the “Holy Grails” of probe microscopy. IR spectroscopy can characterize and identify materials via vibrational resonances of chemical bonds and is a very widely used analytical technique. We have successfully integrated AFM with IR spectroscopy (AFM-IR) to obtain high quality infrared absorption spectra at arbitrary points in an AFM image, thus providing chemical characterization on the sub-100 nm length scale. The webinar will discuss:

How the AFM-IR technique works to provide simultaneous chemical and mechanical property information
NEW: polarization control that enables nanoscale molecular orientation studies. Data will be presented on molecular orientation of individual electrospun PVDF fibers
Applications ranging from reverse engineering to characterization of polymer blends, multilayer films, organic photovoltaics, life sciences etc

You can register at www.anasysinstruments.com

AFM Webinar -”Introduction and Innovations in High Speed, Quantitative Nanomechanical Imaging”, May 23

tmehr — Wed, 16 May 2012 14:56:37 +0000

Asylum Research’s Dr. Roger Proksch will present the webinar “Introduction and Innovations in High Speed Quantitative Nanomechanical Imaging” on May 23 at 8:00am and 5:00pm PDT. This presentation, the first in a three-part series, will begin with a survey of the mechanical properties that can be investigated with the wide array of both old and new nanoscale property mapping techniques available to materials scientists. We will then introduce two new techniques for nanomechanical studies that allow unambiguous interpretation of material properties: AM-FM and Loss Tangent. These techniques allow high speed, low force imaging in tapping mode – a proven, reliable, and gentle imaging technique- while providing quantitative Stiffness and Loss Tangent images. Free registration for either time slot can be found on the link below:

8:00am (PDT), May 23

5:00pm (PDT), May 23

http://www.asylumresearch.com/Webinars/

International Scanning Probe Microscopy Meeting, Toronto, Canada, June 15-18 2012

Leonenko — Sun, 29 Apr 2012 18:38:34 +0000

14th Annual International Scanning Probe Microscopy Meeting, Toronto June 15-18 2012,

Abstract deadline is extended to May 10, 2012,

One day tutorial on Scanning Probe Microscopy on June 15th,

Venue: Westin Harbour Castle Hotel, Toronto, Canada

http://ispm2012.uwaterloo.ca/index.html

Early Registration deadline is May 15th

ISPM 2012 committee

2012 Annual Nanoprobes Workshop at Stanford University

mariaw — Mon, 16 Apr 2012 19:49:16 +0000

You are cordially invited to attend the Center for Probing the Nanoscale’s 8th Annual Workshop, a one-day workshop on nanoscale probing and imaging. Meet CPN investigators and the broader Bay Area community interested in nanoscale imaging and metrology.

Location:
Jen-Hsun Huang Engineering Center, McKenzie Room 300
475 Via Ortega, Stanford, California 94305-4200

Hours:
8:30-6, with continental breakfast and lunch included. There will be a poster session from 4-6, with hors d’oeuvres served. Prizes will be awarded for the top 3 posters

Speakers so far:

Stuart Lindsay, Arizona State University
“Recognition Tunneling – An Interface Between Chemistry and Electronics”

Sarah Tolbert, University of California, Los Angeles
“Self-Organized Nanostructured Materials for Energy: Supercapacitors, Batteries, and Solar Cells“

Felice Frankel, Harvard University
“More Than Pretty Pictures”

Katherine Aidala, Mount Holyoke College
“Manipulating Magnetic States with a Local Circular Magnetic Field”

Carlos Arguello, Columbia University
“Fundamental Role of Disorder in Phase Transitions of Strongly-Interacting Materials”

H. Kumar Wickramasinghe, University of California, Irvine
“Raman Probe Force Microscope”

Ania Bleszynski Jayich, University of California, Santa Barbara
“Coherent Detection of Mechanical Motion with a Single Spin Qubit”

Michael Flatté, University of Iowa
“Nanoscale Manipulation and Control of a Solitary Dopant within a Semiconductor“

James Hone, Columbia University
“Graphene NEMS Resonators in the Quantum Hall Regime“

Fee Information and Registration Link

Questions:
Laraine Lietz-Lucas, lietz@stanford.edu

Postdoctoral Fellow in SPM/Nanomechanics at ExxonMobil

dgyablon — Wed, 11 Apr 2012 17:25:31 +0000

Member of the Technical Staff Post doc Position – Nanomechanical Characterization,

Advanced Sensing and Analytics

ExxonMobil Research and Engineering Company has an immediate opening for a Postdoctoral Fellow at its Corporate Strategic Research laboratory, located in Clinton, NJ, 50 miles from New York City in scenic western New Jersey.

Candidates are sought to fill a research position in the area of nanomechanical characterization with scanning probe microscopy (SPM) based methods. The candidate will conduct research with state of the art SPM instrumentation (including nanoindentation) to develop novel methods in quantitative and semi-quantitative characterization of elastic and viscoelastic materials. The position is primarily experimental-based but will also include simulations of tip-sample interactions and incorporate use of contact mechanics modeling to improve data interpretation.

A Ph.D. in materials science/applied physics/physical chemistry/materials or mechanical engineering and a demonstrated ability to perform independent research is required. A strong background in scanning probe microscopy with a proven track record in research is essential. Experience in advanced scanning probe methods and theory including multifrequency, dynamic methods, nanoindentation, advanced image analysis, nano-thermal analysis methods, tip-sample interaction simulations and contact mechanics is strongly desired. Excellent collaboration and communication skills are required.

ExxonMobil offers a competitive compensation and benefits package and a broad range of opportunities.

Please submit your application letter and resume to our website at www.exxonmobil.com/ex and apply for the Post Doc – Nanomechanical Characterization position.

ExxonMobil is an Equal Opportunity Employer

Stanford Summer Institute for Middle School Teachers – Nanotechnology

mariaw — Thu, 05 Apr 2012 21:05:32 +0000

The Center for Probing the Nanoscale at Stanford University is accepting applications for its annual Summer Institute for Middle School Teachers on July 23-27, 2012. At the Institute, teachers learn about the physical concepts underlying nanotechnology and nanoscience in simple terms. Daily sessions focus on content lectures by Stanford scientists and on inquiry-based modules that explicitly address California’s 5-8th grade physical science content standards. Teachers receive a hands-on activity kit with many fun activities that bring nanoscience into the classroom. Teachers also have the opportunity to tour research labs and to receive a $650 stipend and professional development units. For more information and to apply by May 7, visit http://simst.stanford.edu

Normal force calibration

dave11420 — Tue, 03 Apr 2012 20:51:56 +0000

If I have a silicon substrate and I want to measure normal forces, I take the change in setpoint x the cantilever stiffness x the sensitivity from the force displacement (fd) curves. However, if I am scanning in a liquid (fluid cell) do I use the sensitivity from the fd curves from the liquid or the fd curves from the silicon substrate in air?

Normal force calculation

dave11420 — Mon, 02 Apr 2012 16:59:09 +0000

Associate Research Fellow (Postdoctoral Fellow)

bharish — Tue, 27 Mar 2012 14:16:44 +0000

There are immediate openings for postdoctoral researchers (Associate Research Fellow grades) at the University of Exeter’s Advanced Nanoscale Engineering Laboratory in Devon, United Kingdom. Projects include advanced NEMS devices using novel phase change materials, as well nanomanufacturing. Our lab is excellently linked to several industrial and academic labs around the world. The University has invested heavily in world-class experimental infrastructure, and the successful candidate will be part of our growing team. The fellow would have the freedom to pursue creative ideas, leadership opportunities as well as an excellent support infrastructure.

Exeter is among the most desirable locations in the UK, and is minutes away from dramatic coastlines or if you prefer, just 2.5 hours away from London (or a couple of hours by flight to the beaches of Southern France and Italy).

The most important qualification is the ability to hit the ground running, and extraordinary motivation. A PhD in a related field and evidence of high quality experimental scientific work during the PhD would be required.

Please contact Harish Bhaskaran http://people.exeter.ac.uk/hb306 (e-mail on website) or by phone at +44 – 1392 725 820 for more information.

Monday submission deadline – SPM Polymer symposium at ACS

dgyablon — Fri, 16 Mar 2012 18:29:16 +0000

Call for Abstracts – ACS Fall Meeting, 8/19-8/23 2012, Philadelphia PA

“Advances in Methods and Applications of Scanning Probe Microscopy to Polymer Materials”

This symposium will focus on recent research progress to understand mechanical, rheological, thermal, electrical, and self-assembly behavior of polymers on the nanoscale and to establish composition-processing-morphology-performance relationship. Experimental and theoretical aspects of all SPM based methods will be considered, including traditional mechanical, thermal, and electrical based methods as well as more recent multifrequency measurements and high speed AFM. Application of SPM to a wide variety of polymer materials is to be covered including amorphous and semicrystalline polymers, nanocomposites, block copolymers, elastomers, impact copolymers or toughened polymers, conductive polymers, single polymer chains, etc.

Invited speakers include:

Robert Carpick (University of Pennsylvania), Steve Minne (Bruker), Yifu Ding (University of Colorado), Sergei Magonov (NT-MDT), Liang Fang (Arkema), Ken Nakajima (Tohoku University), Greg Haugstad (University of Minnesota), Rene Overney (University of Washington), Jamie Hobbs (University of Sheffield), Roger Proksch (Asylum Research), Donna Hurley (NIST), Arvind Raman (Purdue University)

Kevin Kjoller (Anasys), Vladimir Tsukruk (Georgia Inst. of Tec)h, Mark Van Landingham (Army Research Lab), Gil Walker (University of Toronto), Robert Magerle (Technical University of Chemnitz), Julius Vancos (Univ. of Twente)

To submit abstract, go to http://abstracts.acs.org, POLY division, this symposium. Abstract and preprint submission deadline on March 19^th, 2012.