These programs, which are based on the Carpick Lab Toolbox, are used to extract the data from a NanoScope data file.

The scaled results are placed in the matrix data, an N x M x L matrix, where N is the number of lines, M is the number of points per line (N = M in most cases), and L is the number of simultaneous data channels recorded.  The assumption is that the first data channel is topgraphy and all the other channels are not topography.  The data output is nm for the first channel and V for all subsequent channels.  It has been tested on data files with only one channel (topography) three channels (topography and LFM forward and back), and four channels (topography, peak force error, inphase and quadrature).

usage: data = open_di(file_name)
To use open_di.m, you need get_num.m (included here) and di_header_find.m (in the Carpick Lab Toolbox).

Original Version:  Jennifer R. Hampton  2/16/09
7/13/10: adapted for NanoScope v 8.1 data files

Changes in v2:
1) Searching the header for scale_data2 now looks for the string ‘\@2:Z scale: V’
2) The output matrix, data, is preallocated before the final loop.

open_di.m

The file open_di.m is based on get_image_data.m from the Carpick Lab Toolbox, but with updated scaling, as described in the comments of the file. The heart of the code (reading data and placing it in the output matrix) is the same as in get_image_data.m.

get_num.m

The file get_num.m is a rewritten version of extract_num.m from the Carpick Lab Toolbox. The change was necessary to make sure that the correct number from each header line was extracted.

open_di_information.txt

The file open_di_information.txt contains the information described above and additional information about the scaling from hardware to physical units.

Synopsis: Materials used in next-generation technological devices will be subjected to nonambient temperatures and high stresses/pressures. A variety of advanced nanomaterials and nano-scaled architectures has been proposed to meet these stringent demands, however a complete understanding of the mechanisms that govern deformation at these scales is still elusive. The mechanical response of nano- and micro-scale components that comprise these devices, such as nano-pillars, nanotubes,nanowires, nanolayers, ultra-thin films, nanoparticles, and nanocrystalline and nanotwinned materials, must be investigated in the context of their unique microstructure and its evolution. It is especially important to understand the role of defects and flaws in these small volumes as their energetics and interactions elicit the observed mechanical response. Accelerated use and integration of nanomaterials can be enabled by the complementary combination of atomistic and multi-scale simulations with integrated in situ instrumentation and techniques, where synthesis, testing, environmental control, and direct imaging occur simultaneously.

Here is the description of the meeting from the website:

Over the past decades, it has been well established that the mechanical behavior of materials changes when they are confined geometrically at least in one dimension to small scale. It is the aim of the 2010 Gordon Conference on “Thin Film and Small Scale Mechanical Behavior” to discuss cutting-edge research on elastic, plastic and time-dependent deformation as well as degradation mechanisms like fracture, fatigue and wear at small scales. As in the past, the conference will benefit from contributions from fundamental studies of physical mechanisms linked to material science and engineering reaching towards application in modern applications ranging from optical and microelectronic devices and nano- or micro-electrical mechanical systems to devices for energy production and storage. The conference will feature entirely new testing methodologies and in situ measurements as well as recent progress in atomistic and micromechanical modeling. Particularly, emerging topics in the area of energy conversion and storage, such as material for batteries will be highlighted. The study of small-scale mechanical phenomena in systems related to energy production, conversion or storage offer an enticing opportunity to materials scientists, who can provide new insight and investigate these phenomena with methods that have not previously been exploited.

Scandem Nordic Microscopy Society Meeting
KTH Electrum, Stockholm, Sweden
Wed. June 9
11:10am

Friday, June 11
10:30am
Room 190, UIUC Engineering Sciences Bldg.

This lecture is open to the public.

Please consider submitting your nanomechanics related abstract to Symposium 4-1 (“Nanomechanics: Beyond Modulus and Hardness”) of the 47^th Annual Technical Meeting of Society of Engineering Science, which takes place October 4-6, 2010 at Iowa State University, Ames, IA. The deadline for abstract submission is 5:00pm CST, Monday, June 7, 2010. The meeting’s homepage can be found at www.ucs.iastate.edu/mnet/ses2010/home.html.

4-1 Nanomechanics: Beyond Modulus and Hardness
Nanoindentation (and its standard outputs of elastic modulus and hardness) has been the staple of nanomechanical testing for nearly two decades. However, in recent years both the technique and its instrumentation have been adapted to yield additional material quantities and new modes of nanoscale measurement. The focus of this symposium is on advanced and novel nanomechanical testing concepts. Examples of appropriate topics include but are not limited to in-situ nanomechanical testing such as in electron microscopes, nanomechanical testing in non-nanoindentation modes such as nanocompression testing of pillars and nanotensile testing of wires and ribbons, and nanoindentation of viscoelastic materials. Submissions concerning elucidation of deformation mechanisms are especially encouraged. Organizer: Oden Warren, Hysitron, Inc., Minneapolis, MN, owarren@hysitron.com.

Note: Ignore start/end times on this post (dates are correct, however)

Anasys Instruments will host a free online webinar on the scientific breakthrough that achieves nanoscale chemical composition based on an AFM probe as a detector for IR spectroscopy.  The technique enables simultaneous information on nanoscale mechanical properties.  The webinar will cover the science behind the breakthrough and the broad applications of the technique ranging from Materials to Life Sciences. The speakers are:

Dr Curt Marcott: Senior Partner, Light Light Solutions; President-Elect, Society of Applied Spectroscopy; Retired Research Fellow, P&G

Dr. Craig Prater: CTO, Anasys Instruments and former Chief Technologist, Veeco Instruments

Kevin Kjoller: co-Founder/VP, Product Development, Anasys Instruments and former Director of Engineering, Veeco Instruments

This workshop of invited and contributed talks will cover the recent advances in characterization of energy-relevant materials systems using SPM/AFM techniques, as well as the state of the art in energy dissipation and transformation measurements by SPM/AFM. The three-day meeting will also include a poster session, as well as an equipment lab and hands-on tutorials for demonstration of recently developed dynamic and multi-spectral SPM/AFM modes on Asylum’s Cypher™ and MFP-3D™ SPM/AFMs. The keynote talk will be on “Local Probing of Carrier Dynamics in Polymer Photovoltaic Materials” by David Ginger of the University of Washington.

Detailed information on the agenda, presentations, and registration can be found at www.asylumresearch.com/Energy.

Major topics to be covered include:
• Mapping of carrier dynamics and photoinduced behavior of photovoltaic materials
• Ionic and electronic transport in fuel cells and Li-ion batteries
• Energy harvesting by piezoelectric and ferroelectric systems,
• Novel advances in functional probes – microwave, thermal, and conductive
• Imaging energy transformations and dissipation by multimodal and Band Excitation SPM/AFM

Wed., April 7
Room 3000 Moscone West
8:30am

The NTEGRA nanolaboratory provides a unique platform for integration of the most insightful and powerful microscopy and spectroscopy techniques. Due to the complete integration of hardware and software, the NTEGRA Spectra (SPM and Raman Confocal Microscope) is able to perform a wide rage of techniques. The system provides all aspects of SPM, Raman Confocal Microscopy and the only commercial system that supports Tip Enhanced Raman Spectroscopy (TERS). The NTEGRA is used in many areas of study including graphene, nanotubes, DNA, polymer science and single molecule research.

You can sign up at https://acs.ewpoplanner.com/index.cfm?fuseaction=expomap.exhibitorworkshops&event_id=1037 under free exhibitor workshops or send an email to brad@nanounity.com.