“Advances in Methods and Applications of Scanning Probe Microscopy to Polymer Materials” co-hosted by the Division of Polymer Chemistry and Division of Colloid and Surface Science.

Abstracts should be submitted on-line on the PACS abstract submission site:  http://abstracts.acs.org. Click on POLY, select this symposium topic and follow instructions to submit an abstract with 150 or less words.  Deadline for abstract submission is March 19^th. 

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Symposium Description:.  This symposium will focus on recent research progress in both developing new SPM based methods for and novel applications of SPM methods to polymer materials.  The focus of developing these new methods and utilizing these applications should be to understand mechanical, rheological, thermal, electrical, and self-assembly behavior of polymers on the nanoscale and to establish composition-processing-morphology-performance relationships of polymers, polymer blends, and composites.  All SPM based methods will be considered, including traditional mechanical (phase, nanoindentation), thermal, and electrical based methods as well as more recently developed methods from single to multifrequency measurements and high speed AFM.   All experimental and theoretical aspects of SPM methods developed with specific relevance to polymer materials or application of such methods to polymer materials  will be covered.  Application of SPM to a wide variety of polymer materials is to be covered including amorphous and semicrystalline polymers, polymer nanocomposites, block copolymers, polymer compounds, elastomers and rubbers, impact copolymers or toughened polymers, conductive polymers, single polymer chains, etc.  Of particular interest is interpretation of AFM measurements that can be related to meaningful and relevant polymer material properties.

Confirmed Invited Speakers Include:

Robert Carpick (University of Pennsylvania), Steve Minne (Bruker), Yifu Ding (University of Colorado), Sergei Magonov (NT-MDT), Liang Fang (Arkema), Ken Nakajima (Tohoku University), Greg Haugstad (University of Minnesota), Rene Overney (University of Washington), Jamie Hobbs (University of Sheffield), Roger Proksch (Asylum Research), Donna Hurley (NIST), Arvind Raman, Purdue University, Kevin Kjoller (Anasys), Vladimir Tsukruk (Georgia Inst. of Tech), Mark Van Landingham (Army Research Lab), Gil Walker (University of Toronto), Robert Magerle (Technical University of Chemnitz) 

Nanovea today announced the arrival of the N3 line dedicated to providing high-end measurement technology to the broader market. Nanovea has fully automated their measurement techniques while designing to price in the $20K market.

This first Asylum Research webinar in our 2012 Webinar Series will be presented by AFM pioneer, inventor and Asylum Research co-founder, Dr. Jason Cleveland.

Date: Wednesday, February 22
Time: 8:00am-9:00am PST

REGISTER NOW

Invited Speakers include:

Wilhelm Barthlott (University of Bonn)
József Fortágh (University of Tübingen)
Ricardo Garcia (IMM Madrid)
Stanislav Gorb (CAU Kiel)
Armin Knoll (IBM Zürich)
Egbert Oesterschulze (TU Kaiserslautern)
Pascal Ruffieux (EMPA)

In addition, contributed talks and posters will be accepted till January 31, 2012. Please send your one-page abstract as a PDF-file via email to hendrik.hoelscher@kit.edu.

Please register by sending the registration to hendrik.hoelscher@kit.edu. The number of attendees is limited. The registration fee for the workshop is 100 €. A reduced fee for students is available at 50 €. Deadline for registration is February 19, 2012.

A Best Poster Award of 300 €, 200 €, and 100 € will be granted to the authors of the three best poster presentations by SPECS Surface Nano Analysis GmbH.

Follow the latest news at our web-page (http://www.imt.kit.edu/afm.php) and spread the word to your colleagues interested into AFM world-wide.

We look forward to welcome you in Karlsruhe!

Thomas Schimmel and Hendrik Hoelscher

The overall focus is to bring together scientists who are active in the field of controlled manipulation of atoms, clusters, and nanoscale objects using scanning probe techniques. This includes basic techniques of manipulation, theoretical description of manipulation processes as well as applications ranging from nano- and mesoscale friction to automatic assembly of nano-objects. One special focus topic of this year’s workshop is AFM based manipulation strategies in the field of life sciences.

Topics include:

- SPM based experimental techniques for manipulation of clusters and nanoscale objects

- Atomic and molecular scale manipulation

- Bio-manipulation

- Theoretical concepts for manipulation approaches and interpretation

- Connections between friction and nanoobject manipulation

- Surface templates for nanomanipulation

The conference will take place at the new building of IMDEA Nanociencia in Madrid, Spain. The registration form will be soon available for download. The social programme will include an excursion to the natural park of Sierra de Guadarrama in the North of Madrid. Please see the website www.nanomanipulation.info for more information.

Hope to see you there,

Prof. Andre Schirmeisen, University of Giessen, Germany; Prof. Adam Foster, Tampere University of Technology, Finland; Dr. Enrico Gnecco, IMDEA Nanociencia, Madrid, Spain; Dr. Karine Mougin, ICSI-CNRS, Mulhouse, France; Prof. Pedro de Pablo, Universidad Autónoma de Madrid, Spain

Applicants must have a doctoral degree in engineering or a related discipline.

Applicants should submit their applications electronically at the website: https://jobs.hr.upenn.edu/applicants/Central?quickFind=194904

Information on Prof. Carpick’s laboratory can be found here: http://www.me.upenn.edu/~carpick/

Information about the Department is available at http://www.me.upenn.edu.

The University of Pennsylvania is an equal opportunity employer.  Minorities, women, individuals with disabilities, and veterans are encouraged to apply.

June 18-21, Santa Clara, CA June 18-21, Santa Clara, CA
Special Symposium: Nanoscale Materials Characterization
www.techconnectworld.com/Nanotech2012/

Most technological research includes advanced characterization at the
nanoscale. This symposium targets a wide range of characterization techniques
including microscopy, scattering, spectroscopy/spectrometry, nanomechanical
and other tools, along with specimen preparation methods and handling. It is
essential that this burgeoning knowledge base be transparently presented to the
broadest technical community. This event promotes the rapid education,
dissemination, and commercialization of new characterization techniques into
industries based in both physical and life sciences. It seeks to introduce general
technique types to newcomers, report pioneering methods, and drill down into
new physical understandings, all the while addressing applications useful to
industrial engineers and technicians.

Advances in characterization include not only far-field probes (e.g., beams of
electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips,
fibers and nanotubes), but also a growing intellectual component whereby data
are manipulated, analyzed, rendered and simulated to yield meaningful
information. As some tools and methods have become more common and
practical, certain misunderstandings and misinterpretations also have crept into
the lexicon. Besides an element of “methods training” to promote the insightful
application of characterization tools in nanotechnology R&D, this symposium will
emphasize projects utilizing a spectrum of complementary techniques.

Topics & Application Areas

• Direct space imaging methods
• Indirect space methods & spectroscopy
• Polymer phase transition & kinetics
• Nanocomposites morphology &
structure
• Thin-film structure
• Characterizing nanocatalysis surfaces
• Micro/nano electronic devices
• Liquid suspensions/melts
• Other

Symposium Co-Organizers:  Dalia Yablon (ExxonMobil), Greg Haugstad (Univ. of Minnesota), Pierre Panine (Xenocs, SA)

Dear Colleague:

You are cordially invited to attend Nanobrücken II:  A Nanomechanical Testing Workshop, jointly presented by INM – Leibniz Institute for New Materials and Hysitron, Inc., with co-sponsorship from the JEOL company. This is the second workshop in the Nanobrücken series.

Professor Jeff De Hosson of the University of Groningen will deliver the keynote address to commence the workshop. This year’s workshop aims to highlight the very latest in hybrid nanomechanical research that utilizes nanomechanical testing combined with complementary techniques such as electrical properties measurements, in-situ observation, dynamic testing, and more. The topics will cover a broad range of materials and structures, and in some cases will emphasize environmental conditions such as temperature and vacuum.

Call for Abstracts and Registration details are available at the Nanobrücken II website. Everyone in the Nanomechanics Community is encouraged to participate in this event. We look forward to welcoming you in Saarbrücken.

Sincerely,
Your Nanobrücken II Program Committee: Prof. Eduard Arzt, INM Saarbrücken; Prof. Roland Bennewitz, INM Saarbrücken; Prof. Lars Hultman, Linköping University; Dr. Andreas Schneider, INM Saarbrücken; Dr. Oden Warren, Hysitron, Inc.

Site: Stanford University

Agilent Technologies’ second biennial “Nano Measure” scientific symposium will feature some of the world’s most prestigious scientists presenting leading-edge, nanomeasurement-driven research. The Nano Measure 2012 program includes four excitingly diverse, applications-focused sessions. All users of atomic force microscopes, nanomechanical test instrumentation, and complementary nanomeasurement techniques and technologies are encouraged to submit paper and poster abstracts online at the symposium website.