Nanoprobe Network

An introduction to atomic force microscopy: methodology & examples. Lecture #1

These are notes from the first of three tutorial lectures being delivered by R.W. Carpick on atomic force microscopy. The lectures are being given at ETH Zürich, on Monday Nov. 8, 15, and 22 in room HCI D2, 15:45 – 16: 45.

This first lecture covers general instrumentation issues and piezo scanners.

AFM_Tutorial_Lecture1_handout_FL

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