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UIUC Invited Lecture Series: High Resolution Imaging and Multifrequency AFM

UIUC Center for Microanalysis of Materials Invited Lecture Series
“High Resolution Imaging and Multifrequency AFM”
presented by Rob Cain, Asylum Research

Friday, June 11
10:30am
Room 190, UIUC Engineering Sciences Bldg.

This lecture is open to the public.

This entry was posted on Wednesday, June 2nd, 2010 at 10:33 am and is filed under General. You can follow any responses to this entry through the RSS 2.0 feed. Comments are open.

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  • Nano/Bio Interface Center
    University of Pennsylvania
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