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Patterning Charge

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Scanning surface potential micrograph (SSPM) of a pattern written by ferroelectric lithography. The ceramic surface was selectively poled using an atomic force microscope (AFM) and then imaged by SSPM, also via the AFM. In this micrograph, the localized surface dipoles appear as having higher surface potential than the background.

This entry was posted on Thursday, April 3rd, 2008 at 9:45 pm and is filed under Ferroelectric Nanolithography, Images. You can follow any responses to this entry through the RSS 2.0 feed. Comments are open.

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