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Here you will find news related to the Nanoprobe Network and other items of interest to the nanoprobe community.

We welcome contributions such as new discoveries and announcements regarding scanning probe science, technology, and industry. Any Nanoprobe Network member can submit a News item for possible inclusion in this section by clicking here to send an email to the Nanoprobe Network administrator. Please include as much information as possible (including website links as appropriate). We will evaluate the contribution for appropriateness and then post it here accordingly. You can become a Nanoprobe Network member by completing a brief registration form here.

  • Webinar-”Smaller and Quieter: Ultra-high Resolution AFM Imaging”, Feb. 22 POSTED BY tmehr ON January 31st, 2012

    Webinar-”Smaller and Quieter: Ultra-high Resolution AFM Imaging”, Feb. 22

    Miniaturization of cantilevers for Atomic Force Microscopy has ...

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  • Abstract deadline for AAFMT 2012 workshop is approaching! POSTED BY hendrikhoelscher ON January 27th, 2012

    Abstract deadline for AAFMT 2012 workshop is approaching!

    The “3rd International Workshop on Advanced Atomic Force Microscopy Techniques 2012” (AAFMT 2012) takes place in Karlsruhe, Germany, March 5-6, 2012. Invited Speakers include: Wilhelm Barthlott (University of Bonn) József Fortágh (University of Tübingen) Ricardo Garcia (IMM Madrid) Stanislav Gorb (CAU Kiel) Armin Knoll (IBM Zürich) Egbert Oesterschulze (TU Kaiserslautern) Pascal Ruffieux (EMPA) In addition, contributed talks and...

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  • NSTI Nanotech Symposium on Nanoscale Materials Characterization POSTED BY dgyablon ON January 17th, 2012

    NSTI Nanotech Symposium on Nanoscale Materials Characterization

    Abstract submission deadline:  January 27th June 18-21, Santa Clara, CA June 18-21, Santa Clara, CA Special Symposium: Nanoscale Materials Characterization www.techconnectworld.com/Nanotech2012/ Most technological research includes advanced characterization at the nanoscale. This symposium targets a wide range of characterization techniques including microscopy, scattering, spectroscopy/spectrometry, nanomechanical and other tools, along with specimen preparation methods and handling. It is essential that...

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  • AFM in Biology Class, Jan. 25-27, 2012 POSTED BY tmehr ON January 5th, 2012

    AFM in Biology Class, Jan. 25-27, 2012

    Seats are still available for the AFM in Biology Class, held at Asylum Research in Santa Barbara, Jan. 25-27, 2012.  Now in its seventh year and 14th session, this world renowned class that covers a variety of topics in AFM life science applications from basic AFM operation and force measurements,...

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  • Open Post-doc Position at KIT POSTED BY hendrikhoelscher ON January 5th, 2012

    Open Post-doc Position at KIT

    The Institute of Microstructure Technology of the Karlsruhe Institute of Technology (KIT) is currently seeking applicants for a two- to three-year postdoctoral position. The project involves studies on cold atom scanning probe microscopy (CA-SPM) [Nat. Nano. 6, 446 (2011)]. Applicants should have a Ph.D. in physics or a related field...

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  • AAFMT 2012 POSTED BY hendrikhoelscher ON December 15th, 2011

    AAFMT 2012

    The “3rd International Workshop on Advanced Atomic Force Microscopy Techniques 2012” (AAFMT 2012) takes place in Karlsruhe, Germany, March 5-6, 2012. Invited Speakers include: Wilhelm Barthlott (University of Bonn) József Fortágh (University of Tübingen) Ricardo Garcia (IMM Madrid) Stanislav Gorb (CAU Kiel) Armin Knoll (IBM Zürich) Egbert Oesterschulze (TU Kaiserslautern) Pascal Ruffieux (EMPA) In addition, contributed talks and...

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