Conference Report on the 12th International Conference on Noncontact Atomic Force Microscopy (NC-AFM 2009)
Progress in nanoscience and nanotechnology requires tools that enable the imaging and manipulation of mater at the atomic and molecular scale. During the last two decades or so, scanning probe based techniques have proven to be most versatile in this regard. Among the various probe-based approaches, atomic force microscopy (AFM) stands out in many (More...)














