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POSTED BY Leonenko ON April 29th, 2012
International Scanning Probe Microscopy Meeting, Toronto, Canada, June 15-18 2012
14th Annual International Scanning Probe Microscopy Meeting, Toronto June 15-18 2012, Abstract deadline is extended to May 10, 2012, One day tutorial on Scanning Probe Microscopy on June 15th, Venue: Westin Harbour Castle Hotel, Toronto, Canada http://ispm2012.uwaterloo.ca/index.html Early Registration deadline is May 15th ISPM 2012 committee...
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POSTED BY mminary2 ON March 23rd, 2011
Calibration of lateral sensitivity of AFM cantilever (mV/nm)
I would like to calibrate the lateral sensitivity of the AFM cantilever. Most of the calibration methods are focused on calibrating the frictional forces and bypass obtaining the lateral sensitivity. For methods such as lateral piezo-response force microscopy, there is no need to know the frictional forces, but just the...
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POSTED BY asf ON February 1st, 2011
2nd European Nanomanipulation Workshop
Dear Colleague, we would like to bring to your attention the 2nd European Nanomanipulation Workshop, which will be held in Tartu, Estonia June 6th-8th 2011 (http://nanomanipulation.ut.ee/). It follows the 1st meeting which was held successfully in Cascais, ...
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POSTED BY tmehr ON January 26th, 2011
Bimodal AFM Tutorial March 13 at the Multifrequency AFM Conference
The need for higher compositional resolution and sensitivity has led to exploration of imaging with higher harmonics and/or flexural or torsional cantilever modes. More recently, the AFM is experiencing the evolution from single to multi-frequency excitation and detection schemes. The Bimodal AFM Tutorial, held the afternoon of March 13, 2011...
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POSTED BY kgertz ON July 6th, 2009
Veeco AFM Webinar: Microscope Image Registration Overlay
Join Veeco to learn how Microscope Image Registration Overlay (MIRO) can both accelerate and enhance discovery in life science applications by combining data from Atomic Force Microscopy (AFM) techniques such as force spectroscopy and HarmoniXâ„¢ with light microscopy techniques such as fluorescence, confocal, and DIC. For your convenience, we will have...
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POSTED BY glengel ON June 23rd, 2009
Free Nanonis Software from SPECS
SPECS GmbH is pleased to offer a valuable teaching tool for newcomers to STM. The available program is identical to the actual control software included with our world renowned SPM control platform. By using the included tutorial and online help, you will learn how to perform a coarse approach, optimize...
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