Nanoprobe Network » AFM

Calibration of lateral sensitivity of AFM cantilever (mV/nm)

mminary2 — Thu, 24 Mar 2011 00:40:43 +0000

I would like to calibrate the lateral sensitivity of the AFM cantilever. Most of the calibration methods are focused on calibrating the frictional forces and bypass obtaining the lateral sensitivity. For methods such as lateral piezo-response force microscopy, there is no need to know the frictional forces, but just the in-plan displacement of the sample surface.

2nd European Nanomanipulation Workshop

asf — Tue, 01 Feb 2011 08:41:59 +0000

Dear Colleague,

we would like to bring to your attention the 2nd European Nanomanipulation Workshop, which will be held in Tartu, Estonia June 6th-8th 2011 (http://nanomanipulation.ut.ee/). It follows the 1st meeting which was held successfully in Cascais, Portugal in 2010 (http://www.icems.ist.utl.pt/functionalisation/nanomanipulation/index.html)

The deadline for abstract submission is March 28th, 2011. This meeting is supported by the ESF FANAS network, and members are eligible for support. A poster summarizing the meeting is attached NanoManipulation2011.

Sincerely,

The Organizing Committee
(Rynno Lohmus, Donats Erts, Adam Foster, Enrico Gnecco and Andre Schirmeisen)

Bimodal AFM Tutorial March 13 at the Multifrequency AFM Conference

tmehr — Wed, 26 Jan 2011 17:03:57 +0000

The need for higher compositional resolution and sensitivity has led to exploration of imaging with higher harmonics and/or flexural or torsional cantilever modes. More recently, the AFM is experiencing the evolution from single to multi-frequency excitation and detection schemes. The Bimodal AFM Tutorial, held the afternoon of March 13, 2011 in conjunction with the 3rd Multifrequency AFM Conference, will cover a variety of topics by leading researchers in the field. Demonstration on AFM instrumentation will occur after the lectures. The tutorial is free to all conference attendees. Seating is limited.

Syllabus

15:00 Introduction to Bimodal AFM
Roger Proksch, Asylum Research

• History, experimental setup

• Lockin amplifiers, amplitude and phase measurements

• Role of feedback

• Calibration issues and solutions

• Application examples from materials, food science,polymers and biology

15:45 Theory of Bimodal AFM
Elena Tomás-Herruzo, IMM, CSIC

• Euler-Bernouilli cantilever beam theory

• Energy virial and dissipation

• Theory of bimodal contrast in air

• Conservative and non-conservative regimes

• Contrast in different channels – topography, amplitude, and phase

16:30 Break

17:00 VEDA as a Tool for Understanding and Exploring Bimodal AFM
Daniel Kiracofe and Arvind Raman, Purdue University

• Motivation for and introduction to VEDA

• Demonstration of a few of the tools and interacting with the GUI

• How to access and connect to nanohub

• Example simulations including dynamic approach curves example and scanning example

18:00 Bimodal AFM Experiment (live)

Registration and Contact Information

Registration can be found on the conference website at:
http://www.imm.cnm.csic.es/spm/multifrequency/home.html

Class size will be limited to 15 participants. For additional information on the conference and tutorial, contact:
Christian Dietz, christian.dietz@imm.cnm.csic.es

Veeco AFM Webinar: Microscope Image Registration Overlay

kgertz — Tue, 07 Jul 2009 00:13:28 +0000

Join Veeco to learn how Microscope Image Registration Overlay (MIRO) can both accelerate and enhance discovery in life science applications by combining data from Atomic Force Microscopy (AFM) techniques such as force spectroscopy and HarmoniXâ„¢ with light microscopy techniques such as fluorescence, confocal, and DIC.

For your convenience, we will have two webinars on Thursday, July 23, 2009

8:30am PDT (11:30am EDT) and 5:30pm PDT (8:30pm EDT).Â Register Today at http://www.veeco.com/support/show_training_detail.aspx?TrainingID=55

Free Nanonis Software from SPECS

glengel — Tue, 23 Jun 2009 14:31:26 +0000

SPECS GmbH is pleased to offer a valuable teaching tool for newcomers to STM. The available program is identical to the actual control software included with our world renowned SPM control platform. By using the included tutorial and online help, you will learn how to perform a coarse approach, optimize feedback control, navigate around a surface, use sophisticated spectroscopy routines, as well as a multitude of other techniques. Experience firsthand the flexibility and power of the Nanonis platform while using it to teach the principles of microscope operation without fear of damaging a microscope or tip.

Download the free software by clicking here

AFM of Biological Interfaces Workshop, Nancy University, France, Oct. 23-24

NN Admin — Fri, 26 Sep 2008 20:26:11 +0000

Biological interfaces are of particular importance and are subject to specific investigations with AFM technology. This workshop, hosted by Nancy University and the LCPME, Atomic Force F&E, and Asylum, will provide a fruitful dialogue between experts in the field and novice or less experienced researchers. The workshop includes invited talks from some of the world’s leading AFM researchers as well as equipment instruction on the MFP-3D AFM. Researchers are invited to submit a talk or a poster. Registration is now open.

Information about event was submitted by Terry Mehr.