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POSTED BY Leonenko ON April 29th, 2012
International Scanning Probe Microscopy Meeting, Toronto, Canada, June 15-18 2012
14th Annual International Scanning Probe Microscopy Meeting, Toronto June 15-18 2012, Abstract deadline is extended to May 10, 2012, One day tutorial on Scanning Probe Microscopy on June 15th, Venue: Westin Harbour Castle Hotel, Toronto, Canada http://ispm2012.uwaterloo.ca/index.html Early Registration deadline is May 15th ISPM 2012 committee...
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POSTED BY tmehr ON January 26th, 2011
Bimodal AFM Tutorial March 13 at the Multifrequency AFM Conference
The need for higher compositional resolution and sensitivity has led to exploration of imaging with higher harmonics and/or flexural or torsional cantilever modes. More recently, the AFM is experiencing the evolution from single to multi-frequency excitation and detection schemes. The Bimodal AFM Tutorial, held the afternoon of March 13, 2011...
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POSTED BY kgertz ON July 6th, 2009
Veeco AFM Webinar: Microscope Image Registration Overlay
Join Veeco to learn how Microscope Image Registration Overlay (MIRO) can both accelerate and enhance discovery in life science applications by combining data from Atomic Force Microscopy (AFM) techniques such as force spectroscopy and HarmoniXâ„¢ with light microscopy techniques such as fluorescence, confocal, and DIC. For your convenience, we will have...
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