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	<title>Nanoprobe Network &#187; Atomic Force Microscopy</title>
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		<title>Bimodal AFM Tutorial March 13 at the Multifrequency AFM Conference</title>
		<link>http://nanoprobenetwork.org/events/bimodal-afm-tutorial-march-13-at-the-multifrequency-afm-conference</link>
		<comments>http://nanoprobenetwork.org/events/bimodal-afm-tutorial-march-13-at-the-multifrequency-afm-conference#comments</comments>
		<pubDate>Wed, 26 Jan 2011 17:03:57 +0000</pubDate>
		<dc:creator>tmehr</dc:creator>
				<category><![CDATA[Events]]></category>
		<category><![CDATA[AFM]]></category>
		<category><![CDATA[Atomic Force Microscopy]]></category>
		<category><![CDATA[SPM]]></category>

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		<description><![CDATA[The need for higher compositional resolution and sensitivity has led to exploration of imaging with higher harmonics and/or flexural or torsional cantilever modes.  More recently, the AFM is experiencing the evolution from single to multi-frequency excitation and detection schemes. The Bimodal AFM Tutorial, held the afternoon of March 13, 2011 in conjunction with the 3rd [...]]]></description>
			<content:encoded><![CDATA[<p>The need for higher compositional resolution and sensitivity has led to exploration of imaging with higher harmonics and/or flexural or torsional cantilever modes.  More recently, the AFM is experiencing the evolution from single to multi-frequency excitation and detection schemes. The Bimodal AFM Tutorial, held the afternoon of March 13, 2011 in conjunction with the <strong><a href="http://www.imm.cnm.csic.es/spm/multifrequency/home.html">3rd Multifrequency AFM Conference</a></strong>, will cover a variety of topics by leading researchers in the field.<span id="more-859"></span>  Demonstration on AFM instrumentation will occur after the lectures. The tutorial is free to all conference attendees. Seating is limited.</p>
<p><em><strong>Syllabus</strong></em></p>
<p>15:00	<strong>Introduction to Bimodal AFM<br />
</strong><em>Roger Proksch, Asylum Research</em></p>
<p>•	History, experimental setup</p>
<p>• 	Lockin amplifiers, amplitude and phase measurements</p>
<p>•	Role of feedback</p>
<p>• 	Calibration issues and solutions</p>
<p>•	Application examples from materials, food science,polymers and biology</p>
<p>15:45	<strong>Theory of Bimodal AFM</strong><br />
<em>Elena Tomás-Herruzo, IMM, CSIC</em></p>
<p><em>• </em>Euler-Bernouilli cantilever beam theory</p>
<p>•<em> </em>Energy virial and dissipation</p>
<p>•	Theory of bimodal contrast in air</p>
<p>•	Conservative and non-conservative regimes</p>
<p>•	Contrast in different channels – topography, amplitude, and phase</p>
<p>16:30	Break</p>
<p>17:00	<strong>VEDA as a Tool for Understanding and Exploring Bimodal AFM</strong><br />
<em>Daniel Kiracofe and Arvind Raman, Purdue University</em></p>
<p>•	Motivation for and introduction to VEDA</p>
<p>•	Demonstration of a few of the tools and interacting with the GUI</p>
<p>•	How to access and connect to nanohub</p>
<p>•	Example simulations including dynamic approach curves example and scanning example</p>
<p>18:00	<strong>Bimodal AFM Experiment <em>(live)</em></strong></p>
<p><em><strong>Registration and Contact Information</strong></em></p>
<p>Registration can be found on the conference website at:<br />
<strong>http://www.imm.cnm.csic.es/spm/multifrequency/home.html</strong></p>
<p>Class size will be limited to 15 participants. For additional information on the conference and tutorial, contact:<br />
Christian Dietz, <a href="mailto:christian.dietz@imm.cnm.csic.es">christian.dietz@imm.cnm.csic.es</a></p>
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		<title>Veeco AFM Webinar: Microscope Image Registration Overlay</title>
		<link>http://nanoprobenetwork.org/general/veeco-afm-webinar-series-microscope-image-registration-overlay</link>
		<comments>http://nanoprobenetwork.org/general/veeco-afm-webinar-series-microscope-image-registration-overlay#comments</comments>
		<pubDate>Tue, 07 Jul 2009 00:13:28 +0000</pubDate>
		<dc:creator>kgertz</dc:creator>
				<category><![CDATA[Events]]></category>
		<category><![CDATA[General]]></category>
		<category><![CDATA[AFM]]></category>
		<category><![CDATA[Atomic Force Microscopy]]></category>
		<category><![CDATA[Integrated AFM and Light Microscopy]]></category>
		<category><![CDATA[Light Microscopy]]></category>

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		<description><![CDATA[Join Veeco to learn how Microscope Image Registration Overlay (MIRO) can both accelerate and enhance discovery in life science applications by combining data from Atomic Force Microscopy (AFM) techniques such as force spectroscopy and HarmoniXâ„¢ with light microscopy techniques such as fluorescence, confocal, and DIC. For your convenience, we will have two webinars on Thursday, [...]]]></description>
			<content:encoded><![CDATA[<p>Join Veeco to learn how <a href="http://www.veeco.com/promos/default.aspx?PromoID=48&amp;ts=6/1/2009\%206:06:31\%20PM"><strong>Microscope Image Registration Overlay (MIRO)</strong></a> can both accelerate and enhance discovery in life science applications by combining data from Atomic Force Microscopy (AFM) techniques such as force spectroscopy and HarmoniXâ„¢ with light microscopy techniques such as fluorescence, confocal, and DIC.</p>
<p><strong>For your convenience, we will have two webinars on Thursday, July 23, 2009</strong></p>
<p><strong> </strong></p>
<p><strong>8:30am PDT (11:30am EDT) and 5:30pm PDT (8:30pm EDT).Â  Register Today at <a href="http://www.veeco.com/support/show_training_detail.aspx?TrainingID=55">http://www.veeco.com/support/show_training_detail.aspx?TrainingID=55</a></strong> <span id="more-240"></span></p>
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