Veeco AFM Webinar: Microscope Image Registration Overlay

Join Veeco to learn how Microscope Image Registration Overlay (MIRO) can both accelerate and enhance discovery in life science applications by combining data from Atomic Force Microscopy (AFM) techniques such as force spectroscopy and HarmoniXâ„¢ with light microscopy techniques such as fluorescence, confocal, and DIC.

For your convenience, we will have two webinars on Thursday, July 23, 2009

8:30am PDT (11:30am EDT) and 5:30pm PDT (8:30pm EDT).  Register Today at http://www.veeco.com/support/show_training_detail.aspx?TrainingID=55

RSS

| Trackback URL

Comments »

No comments yet.

You must be logged in to post a comment.

Trackback responses to this post

Comments RSS